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Architecture-based reliability prediction with the palladio component model

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اقرأ أكثر حفظ في قائمتي
  • معلومة اضافية
    • بيانات النشر:
      Institute of Electrical and Electronics Engineers
    • الموضوع:
      2012
    • Collection:
      KITopen (Karlsruhe Institute of Technologie)
    • Relation:
      info:eu-repo/semantics/altIdentifier/wos/000311556100005; info:eu-repo/semantics/altIdentifier/issn/0098-5589; https://publikationen.bibliothek.kit.edu/1000030588
    • الدخول الالكتروني :
      https://publikationen.bibliothek.kit.edu/1000030588
    • Rights:
      info:eu-repo/semantics/openAccess
    • الرقم المعرف:
      edsbas.118C220