نبذة مختصرة : International audience; Multi-anvil and laser-heated diamond anvil methods areused to subject Ge and Si mixtures to pressures and temperaturesof between 12 and 17 GPa and 1500 – 1800 K, respectively.Synchrotron angle dispersive X-ray diffraction, precession electrondiffraction and chemical analysis using electron microscopy, revealrecovery at ambient pressure of hexagonal Ge-Si solid solutions(P63/mmc). Taken together, the multi-anvil and diamond anvil resultsreveal that hexagonal solid solutions can be prepared for all Ge-Sicompositions. This hexagonal class of solid solutions constitutes asignificant expansion of the bulk Ge-Si solid solution family, and is ofactive interest for optoelectronic applications.
No Comments.