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Elaboration of near‐valence band defect states leading deterioration of ambipolar operation in SnO thin‐film transistors

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اقرأ أكثر حفظ في قائمتي
  • معلومة اضافية
    • بيانات النشر:
      Wiley, 2021.
    • الموضوع:
      2021
    • ISSN:
      2688-4011
    • Rights:
      OPEN
    • الرقم المعرف:
      edsair.doi...........35a6640d2d0641cf234c83ada4d74ef2