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The Extended Range of Reaction-layer Fatigue Susceptibility of Polycrystalline Silicon Thin Films.

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  • المؤلفون: Pierron, O. N.1; Muhlstein, C. L.1
  • المصدر:
    International Journal of Fracture. Sep2005, Vol. 135 Issue 1-4, p1-18. 18p. 2 Diagrams, 11 Graphs.