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Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis.
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- المؤلفون: Obua, Tonny1 (AUTHOR) ; Sserumaga, Julius Pyton2 (AUTHOR) ; Tukamuhabwa, Phinehas1 (AUTHOR) ; Namara, Mercy1 (AUTHOR) ; Awio, Bruno1 (AUTHOR) ; Mugarra, Johnson1 (AUTHOR) ; Tusiime, Geoffrey1 (AUTHOR); Chigeza, Godfree3 (AUTHOR)
- المصدر:
Agronomy. Dec2024, Vol. 14 Issue 12, p2826. 14p.
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