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Using Micro-XRF to Quantify Thickness and Composition of Thin-Film Solar Cells.
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- المؤلفون: Lee, Andrew1
- المصدر:
American Laboratory. Jan/Feb2014, Vol. 46 Issue 1, p13-16. 4p.
- الموضوع:
- معلومة اضافية
- نبذة مختصرة :
The article discusses the thickness and composition of thin-film solar cells using micro X-ray fluorescence (XRF). Topics include properties of thin-film solar cells and current techniques, copper indium gallium selenide/molybdenum glass, and the advantage of XRF as the nondestructive X-ray beam. It also demonstrates the typical arrangements of thin films for a solar cell, and the behavior of intensity ratio against thickness.
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