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  • 1-10 ل  712 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""

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Collection : Universite De Lyon
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Conference

A Fuzzy Logic-Based System for Detecting Trustable Physical Unclonable Functions

Subjects: physical unclonable functions; PUF security; fuzzy logic in PUFIschia; Italy

  • Source: 31st IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2025)https://hal.science/hal-0519462031st IEEE International Symposium on On-Line Testing and Robust

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Conference

European Test Symposium Teams : an Anniversary Snapshot

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsTallinn; EstoniaTallinn, Estonia

  • Source: 2025 IEEE European Test Symposium (ETS)ETS 2025 - 30th IEEE European Test Symposiumhttps://hal.science/hal-05173907ETS 2025 - 30th IEEE European Test Symposium, May 2025, Tallinn,

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Conference

Late Breaking Results: Automatic Anomaly Detection Method in Physical Unclonable Functions using Data Mining Techniques

Subjects: Physical Unclonable Functions; pattern detection; data mining in PUFLyon; France

  • Source: Design, Automation & Test in Europe Conference (DATE 2025) ; https://hal.science/hal-05085391 ; Design, Automation & Test in Europe Conference (DATE 2025), Mar 2025, Lyon, France.

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Conference

Fault injection attacks on unpowered devices

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGardanne; France

  • Source: Workshop on Practical Hardware Innovations in Security Implementation and Characterization (PHISIC) ; https://hal.science/hal-05082401 ; Workshop on Practical Hardware Innovations in Security

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Conference

MicroFI: Tensorflow Lite based Fault Injection Framework for Microcontrollers

Subjects: PACS 85.42; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsTempe; United States

  • Source: IEEE VLSI Test Symposium (VTS, 2025) ; https://hal.science/hal-05012276 ; IEEE VLSI Test Symposium (VTS, 2025), Apr 2025, Tempe, United States ; IEEELink

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Academic Journal

Brain‐Inspired Polymer Dendrite Networks for Morphology‐Dependent Computing Hardware

Subjects: unconventional computing; morphology-dependent hardware; electropolymerization

  • Source: ISSN: 2198-3844 ; Advanced Science ; https://hal.science/hal-05214086 ; Advanced Science, In press, ⟨10.1002/advs.202502291⟩.

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Academic Journal

All‐in‐One Analog AI Hardware: On‐Chip Training and Inference with Conductive‐Metal‐Oxide/HfO x ReRAM Devices

Subjects: analog ReRAM; deep neural networks; inference

  • Source: ISSN: 1616-301X.

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Academic Journal

Selective Transparent Contacts Based on a Hafnium‐Titanium Oxide Alloy with Optimized Band Alignment for c‐Si Solar Cells

Subjects: atomic layer deposition band alignment photovoltaic selective contacts; atomic layer deposition; band alignment

  • Source: ISSN: 2196-7350 ; Advanced Materials Interfaces ; https://hal.science/hal-05078472 ; Advanced Materials Interfaces, In press, ⟨10.1002/admi.202500083⟩.

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Academic Journal

Fabrication and characterization of high performance sub-millimetric InGaP/InGaAs/Ge solar cells

Subjects: III-V semiconductors Micro-CPV Micro-cells Triple junctions solar cells Micro-fabrication; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic

  • Source: ISSN: 0927-0248.

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Conference

Éteindre votre composant électronique ne le protège pas !

Subjects: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsRennes; France

  • Source: JAIF 2024 - Journée thématique sur les attaques par injection de fautes ; https://hal.science/hal-04934946 ; JAIF 2024 - Journée thématique sur les attaques par injection de fautes, Oct 2024,

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  • 1-10 ل  712 نتائج ل ""[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics""